RELATED DOCUMENTS:

• Barnes, John R., "Designing Electronic Equipment for ESD Immunity-- Part I".
• Barnes, John R., "Designing Electronic Equipment for ESD Immunity-- Part II".
• Barnes, John R., "Designing Electronic Systems for ESD Immunity".
• Annotated Bibliography
• Sources of Information & Want List

The following keywords (key phrases) are used in the annotated bibliography for John R. Barnes' article "Designing Electronic Equipment for ESD Immunity":

• Air discharge,
• Aluminum tape,
• Analog circuits,
• Antennas,
• Arcing,
• Audit trails,
• Balance,
• Bandwidth,
• Bibliography,
• Bipolar devices,
• Blocking,
• Bonding,
• Breakdown strength,
• Bypassing/decoupling,
• Cable entry points,
• Cable routing,
• Cables,
• Capacitance,
• Capacitive coupling,
• Capacitors,
• Case histories,
• Charge injection,
• Charged device model (CDM),
• Checkpoints,
• Checksums,
• Clamping voltage,
• Clamps,
• CMOS devices,
• Cold start,
• Common-impedance coupling,
• Common-mode,
• Common-mode chokes,
• Computer crashes,
• Conductive charging,
• Conductive coatings,
• Conductive fabrics,
• Conductive fillers,
• Conductive paints,
• Conductive plating,
• Connectors,
• Contact discharge,
• Controls,
• Copper tape,
• Corona,
• Corrosion,
• Crowbars,
• Current probes,
• Cyclic redundancy check (CRC),
• Data errors,
• Derating components,
• Diagnostics,
• Differential mode,
• Disabled states,
• Discoidal capacitors,
• Dipole model,
• Direct discharge,
• Double-sided boards,
• Edge-triggered logic,
• Electric field,
• Electro-explosive devices (EED's),
• Electromagnetic pulse (EMP) protection,
• Enclosures/housings,
• Error-correcting codes (ECC),
• Error detection,
• Error logging,
• Error recovery,
• ESD charge,
• ESD current,
• ESD current path,
• ESD damage,
• ESD duration,
• ESD energy,
• ESD frequency range,
• ESD immunity,
• ESD monitor,
• ESD performance criteria,
• ESD risetime,
• ESD severity levels,
• ESD simulator (charged device model),
• ESD simulator (crossed-vane),
• ESD simulator (furniture ESD),
• ESD simulator (human body model),
• ESD simulator (machine model),
• ESD simulator (other),
• ESD simulator (transmission line pulse),
• ESD sources,
• ESD standards,
• ESD testing,
• ESD upsets,
• ESD voltage,
• ESD waveform,
• Ethernet,
• Exception handling,
• Fail safe,
• Failure modes,
• Fasteners,
• Fault tolerance,
• Feedthrough capacitors,
• Ferrite beads/sleeves,
• Field-induced breakdown (FIB),
• Filters,
• Floating inputs,
• Framing,
• Furniture ESD,
• Galvanic series,
• Gas tubes,
• Gaskets,
• Ground fill,
• Ground grids,
• Ground planes,
• Ground straps,
• Ground wires,
• Grounding,
• Guard rings,
• Hand/tool model,
• Handshaking,
• Hangs,
• Heatsinks,
• High-frequency measurements,
• Human body model (HBM),
• Humidity,
• Indicators,
• Indirect discharge,
• Induced charge,
• Inductance,
• Inductive charging,
• Inductive coupling,
• Inductors,
• Input checks,
• Input/Output (I/O) circuits,
• Input/Output (I/O) errors,
• Input protection,
• Intermittent errors,
• Interrupts,
• Keyboards,
• Laser,
• Latch-up,
• Lead-length effects,
• Leakage current,
• Level-sensitive logic,
• Lightning protection,
• Liquid Crystal Display (LCD) panels,
• Lock-ups,
• Loop area,
• Machine Model (MM),
• Magnetic field,
• Magnetoresistive (MR) recording heads,
• Memory access time,
• Memory errors,
• Metal-oxide varistors (MOV's),
• Metalized fabric,
• MOSFET's,
• Multifunction capacitors (MFC's),
• Multilayer boards,
• Noise-energy immunity,
• Noise immunity,
• Openings,
• Optoisolators,
• Output checks,
• Output protection,
• Parasitic SCR,
• Parity,
• Paschen's Law,
• Pigtails,
• PIN diodes,
• Potential,
• Power cords,
• Power distribution,
• Power protection,
• Power supplies,
• Power supply monitors,
• Printed circuit boards (PCB's),
• Program flow errors,
• Radio Frequency (RF) circuits,
• Range checking,
• Redundancy,
• Refreshing peripherals,
• Resets,
• Resetting,
• Resistance,
• Resistors,
• Response time,
• Rounded corners,
• Run-time checks,
• Safe state,
• Sampling data,
• Scaling laws,
• Seams,
• Secondary arcs,
• Sharp edges/points,
• Shielding,
• Shock threshold,
• Showering arcs,
• Shunting,
• Sidactors,
• Slots,
• Software,
• Spacing,
• Spark gaps,
• Static dissipaters,
• Strobing data,
• Substitute parts,
• Switches,
• Thyristors,
• Tokens,
• Transfer Impedance,
• Transposing lines,
• Transient voltage suppressors (TVS's),
• Transils,
• Triboelectric charging,
• Triboelectric series,
• Twisted pairs,
• Type checking,
• Universal serial bus (USB),
• Unused memory,
• Unusual forms of ESD,
• Wait states,
• Warm start,
• Watchdog timers,
• Weather,
• Work function,
• Zener diodes,

We'd like to thank all of the clients who chose dBi to test their products from 1995 to 2013. Below is a brief summary of our accomplishments during the 18 years we were in business.

From 1995 to 2001, under Don Bush's ownership and operation, dBi:

• Did the official approval testing of 141 products developed by 20 client companies.
• Did the official FCC/ Industry Canada (IC) Verification and Declaration of Conformity (DoC) testing of 92 products.
• Did the official FCC/IC Certification testing of 15 products.
• Did the official CE Marking testing of 100 products.

From 2002 to 2013, under John Barnes' ownership and operation, dBi:

• Tested 389 products and 2 testers developed by 44 client companies.
• Did the official approval testing of 357 products and 2 testers, getting all but 5 of them to meet all of the FCC, Industry Canada (IC), CE Marking, C-Tick, and Regulatory Compliance Mark (RCM) standards and requirements for their desired market areas.
• Did the official FCC/IC Verification and Declaration of Conformity (DoC) testing of 296 products.
• Did the official FCC/IC Certification testing of 24 products.
• Did the official CE Marking testing of 271 products and 2 testers.
• Did the official e-Mark testing of 3 products.
• Did the official Australia/New Zealand Verification testing of 170 products.
• Co-sponsored John's writing the Robust Electronic Design Reference Book, Volumes I and II.
• Served as an expert witness on electronics in three lawsuits.

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Last revised December 19, 2010.