EMC/EMI/ESD STANDARDS FOR INFORMATION TECHNOLOGY EQUIPMENT (ITE)

dBi Corporation


Laboratory
Certificate Number 1985-01

John R. Barnes
23 JUL 2003
jrbarnes@iglou.com

EN 55022:1998 and EN55022:1998 Amendment A1:2000 deferred to 1 AUG 2005.

Many countries require information technology equipment (ITE), such as computers, printers, peripherals, etc., to meet certain:

to be marketed and/or used in those countries.

In some markets the manufacturer/distributor may choose from several standards. Each of these standards has different test requirements and different spans of time over which they may be used. A key factor in your decision should be the "withdrawn" date or the "date of cessation of presumption of conformity", which is the latest date at which you may legally import products into that market under the standard.

This document briefly summarizes the EMC/EMI/ESD standards for ITE that is to be marketed and used in:

Information technology equipment (ITE) that is to be marketed in Australia and New Zealand must meet one of these two emissions standards:
ITE that is to be marketed in Canada must meet one of these two emissions standards:
ITE that is to be marketed in China must meet this emissions standard:
ITE that is to be marketed in Europe must meet an: The emissions standard must be one of: The immunity standard must be one of: The harmonics standard must be one of: The flicker standard must be one of:
ITE that is to be marketed in Japan must meet this emissions standard if the manufacturer belongs to VCCI:
ITE that is to be marketed in Taiwan must meet this emissions standard:
ITE that is to be marketed in the United States must meet one of these two emissions standards:
CISPR Class A Radiated Limits at 10m: CISPR Class A Conducted Limits for Mains Ports: CISPR Class A Conducted Common Mode Voltage Limits for Telecommunication Ports: CISPR Class A Conducted Common Mode Current Limits for Telecommunication Ports:
CISPR Class B Radiated Limits at 10m: CISPR Class B Conducted Limits for Mains Ports: CISPR Class B Conducted Common Mode Voltage Limits for Telecommunication Ports: CISPR Class B Conducted Common Mode Current Limits for Telecommunication Ports:
CSA C108.8-M1983 Class A Radiated Limits at 30m: CSA C108.8-M1983 Class A Conducted Limits for Mains Ports:
CSA C108.8-M1983 Class B Radiated Limits at 3m: CSA C108.8-M1983 Class B Conducted Limits for Mains Ports:
The FCC requires Radiated Emissions to be measured up to: FCC Class A Radiated Limits at 10m: FCC Class A Conducted Limits for Mains Ports up to 10 JUL 2002: FCC Class A Conducted Limits for Mains Ports after 10 JUL 2002: Two-year transition period (10 JUL 2002 to 10 JUL 2004) for new authorizations under FCC Part 15 and Part 18- may use old or new FCC conducted limits. Three-year transition period (10 JUL 2002 to 10 JUL 2005) for manufacturing and imports of FCC Part 15 and Part 18 devices- may comply with old or new FCC conducted limits. After transition period all authorizations and newly- manufactured/imported devices must comply with new limits.
FCC Class B Radiated Limits at 3m: FCC Class B Conducted Limits for Mains Ports up to 10 JUL 2002: FCC Class B Conducted Limits for Mains Ports after 10 JUL 2002: Two-year transition period (10 JUL 2002 to 10 JUL 2004) for new authorizations under FCC Part 15 and Part 18- may use old or new FCC conducted limits. Three-year transition period (10 JUL 2002 to 10 JUL 2005) for manufacturing and imports of FCC Part 15 and Part 18 devices- may comply with old or new FCC conducted limits. After transition period all authorizations and newly- manufactured/imported devices must comply with new limits.
Performance criterion A: the equipment operates as intended without operator intervention.

Performance criterion B: no degradation of performance or loss of function (below a level specified by the manufacturer) during the test; after the test the equipment operates as intended without operator intervention.

Performance criterion C: loss of function is permitted during the test if it is self-recoverable or can be restored by the operator; must not lose functions or data stored in non-volatile memory or protected by battery backup.

NOTE: ??? means that no withdrawal date has been published for this standard, as of the date of this document.

DISCLAIMER
These documents are freely offered to anyone who wishes to use them. No warranty for their use is expressed or implied. The most-current versions may be downloaded from the dBi Corporation web site http://www.dbicorporation.com/. The information in these documents is believed to be correct, as far as it goes, because they are based strictly on the FCC regulations, Official Journal of the European Communities (OJ) and the test standards themselves- see Bibliography. Nevertheless, please base your decisions on the current FCC regulations, appropriate issue(s) of the OJ, the pertinent test standard(s), and their amendments.

COMMENTS
If you refer to one or more of these documents in written communications, please attribute them to http://www.dbicorporation.com/. Similarly, if you link to them from your own web page(s), we would appreciate an E-mail to jrbarnes@iglou.com giving the universal resource link (URL) so that we may provide a reciprocal link.

Please send critiques, corrections, and/or additions to jrbarnes@iglou.com , or by snailmail to:
John Barnes
dBi Corporation
216 Hillsboro Ave
Lexington, KY 40511-2105

Robust Electronic Design, Inc. is the research arm of dBi Corporation, an A2LA-accredited EMC/EMI/ESD testing and consulting company based in Lexington, Kentucky. Our staff has been directly involved in putting over 113 major electronic products into mass production at Sycor, IBM, and Lexmark. We have over 30 years experience in the computer and electronics industries developing electronic equipment and electronic products that:
  1. Work.
  2. Are safe and reliable.
  3. Can be manufactured, tested, repaired, and serviced economically.
  4. May be sold and used worldwide.
  5. Can be easily adapted/enhanced to meet new and changing requirements.

Our President, John R. Barnes, is a Professional Engineer licensed in the state of Kentucky, a NARTE-Certified Electromagnetic Compatibility Engineer, a NARTE-Certified Electrostatic Discharge Control Engineer, a Senior Member of the IEEE, and an Advanced-class amateur radio operator. He has written one book, Electronic System Design: Interference and Noise Control Techniques, that was published in English and Russian. He is writing his second book, Robust Electronic Design Reference for Kluwer, due out in late 2003. He has also written articles on designing electronics for electrostatic discharge (ESD) immunity for Printed Circuit Design and Conformity magazines.

Robust Electronic Design, Inc. and dBi Corporation may be contacted by:

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Last revised July 23, 2003.