VOLTAGE DIP STANDARDS FOR INFORMATION TECHNOLOGY EQUIPMENT (ITE) AND RELATED (GENERIC) EQUIPMENT

dBi Corporation


Laboratory
Certificate Number 1985-01

John R. Barnes
28 JUN 2002
jrbarnes@iglou.com

This document briefly summarizes the following families of voltage dip standards for information technology equipment (ITE) and related (generic) equipment:

NOTE: ??? means that no withdrawal date has been published for this standard, as of the date of this document.

DISCLAIMER
These documents are freely offered to anyone who wishes to use them. No warranty for their use is expressed or implied. The most-current versions may be downloaded from the dBi Corporation web site http://www.dbicorporation.com/. The information in these documents is believed to be correct, as far as it goes, because they are based strictly on the FCC regulations, Official Journal of the European Communities (OJ) and the test standards themselves- see Bibliography. Nevertheless, please base your decisions on the current FCC regulations, appropriate issue(s) of the OJ, the pertinent test standard(s), and their amendments.

The "References standards:" and "Referenced by standards:" sections in particular are known to be incomplete. These sections can only be filled out by referring to the exact test standard/amendment. And we don't want to spend up to several hundred dollars buying a standard to get this information, when the OJ tells us that it is identical to one we already own!

COMMENTS
If you refer to one or more of these documents in written communications, please attribute them to http://www.dbicorporation.com/. Similarly, if you link to them from your own web page(s), we would appreciate an E-mail to jrbarnes@iglou.com giving the universal resource link (URL) so that we may provide a reciprocal link.

Please send critiques, corrections, and/or additions to jrbarnes@iglou.com , or by snailmail to:
John Barnes
dBi Corporation
216 Hillsboro Ave
Lexington, KY 40511-2105

dBi Corporation is an A2LA-Accredited EMC/EMI/ESD test house based in Lexington, Kentucky. We test information technology equipment (ITE) and related products for manufacturers/distributors of these products. We also offer training, consulting, and design review services in these areas.

We are closely associated with Robust Electronic Design , Inc., which researches topics of general interest to the electronics industry. This web site is shared by both companies, and may be accessed via http://www.dbicorporation.com/ or http://www.r-e-d-inc.com/

Both companies may be contacted by E-mail at jrbarnes@iglou.com or by snail-mail at:
dBi Corporation
216 Hillsboro Ave
Lexington, KY 40511-2105
     OR
Robust Electronic Design, Inc.
216 Hillsboro Ave
Lexington, KY 40511-2105

Last revised June 28, 2002.


Standard: EN 61000-4-11:1994
Title: Electromagnetic Compatibility (EMC) - Part 4: Testing and Measurement
Techniques - Section 11: Voltage Dips, Short Interruptions, and Voltage
Variations Immunity Tests
Equivalent standards: IEC 1000-4-11:1994, IEC 61000-4-11:1994
Replaces standard:
Replaced by standard:
Ratified/printed: 1 JUN 1994
Published in Official Journal: 3 APR 1998 C101 Volume 41 (referenced by EN
50082-1:1997 for generic)
Must use starting: 1 JUL 2001 (referenced by EN 50082-1:1997 for generic)
Must use until:
Withdrawn:
Countries: Europe
References standards:
Referenced by standards:
* EN 50082-1:1997
* EN 50082-2:1995
* EN 55024:1998
* EN 55024:1998 +Amendment A1:2001
* EN 61000-6-1:2001
* EN 61000-6-2:1999
* EN 61000-6-2:2001
Comments:

Standard: IEC 1000-4-11:1994 (dBi & EMC Lab have standard, reissued as IEC
61000-4-11:1994 on 1 JAN 1997)
Title: Electromagnetic compatibility (EMC) - Part 4: Testing and measurement
techniques - Section 11: Voltage dips, short interruptions and voltage
variations immunity tests
Equivalent standards: EN 61000-4-11:1994, IEC 61000-4-11:1994
Replaces standard:
Replaced by standard: IEC 61000-4-11:2001 ?
Ratified/printed: JUN 1994
Published in Official Journal:
Must use starting:
Must use until:
Withdrawn:
Countries:
References standards:
* IEC 50(161):1990
* IEC 68-1:1988
* IEC 1000-2-1:1990
* IEC 1000-2-2:1990
* IEC 1000-4-1:1992
Referenced by standards:
* CISPR 24:1997
* CISPR 24:1997 +Amendment 1:2001
* EN 50082-1:1997
* EN 50082-2:1995
* EN 55024:1998
Comments:

Standard: IEC 61000-4-11:2001 (dBi has standard)
Title: Electromagnetic compatibility (EMC) - Part 4-11: Testing and measurement
techniques - Voltage dips, short interruptions and voltage variations immunity
tests
Equivalent standards: IEC 1000-4-11:1994 +Amendment 1:2000
Replaces standard:
Replaced by standard:
Ratified/printed: MAR 2001
Published in Official Journal:
Must use starting:
Must use until:
Withdrawn:
Countries:
References standards:
* IEC 60050(161):1990
* IEC 60068-1:1988
* IEC 61000-2-1:1990
* IEC 61000-2-2:1990
* IEC 61000-4-1:1992
Referenced by standards:
* EN 61000-6-1:2001
* EN 61000-6-2:2001
Comments: Clause 8.1.1 changed - climatic conditions shall be within limits
specified for the EUT and the test equipment. Clause 9 changed -
classifications of test results changed to a through d. Clause 10 added -
specific information required in test report.

Standard: IEC 61000-4-11:1994 (was IEC 1000-4-11:1994 until 1 JAN 1997)
Title: Electromagnetic compatibility (EMC) - Part 4: Testing and measurement
techniques - Section 11: Voltage dips, short interruptions and voltage
variations immunity tests
Equivalent standards: EN 61000-4-11:1994, IEC 1000-4-11:1994
Replaces standard:
Replaced by standard: IEC 61000-4-11:2001 ?
Ratified/printed: JUN 1994
Published in Official Journal:
Must use starting:
Must use until:
Withdrawn:
Countries:
References standards:
* IEC 50(161):1990
* IEC 68-1:1988
* IEC 1000-2-1:1990
* IEC 1000-2-2:1990
* IEC 1000-4-1:1992
Referenced by standards:
* CISPR 24:1997
* CISPR 24:1997 +Amendment 1:2001
* EN 50082-1:1997
* EN 50082-2:1995
* EN 55024:1998
* EN 55024:1998 +Amendment A1:2001
* EN 61000-6-1:2001
* EN 61000-6-2:1999
* EN 61000-6-2:2001
Comments: