Voltage Dip/Voltage Interruption Standards for Commercial Electronic Products

dBi Corporation


A2LA Accredited Laboratory
Certificate Number 1985-01

John R. Barnes KS4GL, PE, NCE, NCT, ESDC Eng, ESDC Tech, PSE, SM IEEE
January 6, 2010
jrbarnes@iglou.com

Voltage Dip/ Voltage Interruption tests check the behavior of products when the supply voltage:

Voltage dips are usually caused by nearby heavy equipment coming online or starting up, thus their depth and duration are widely variable, and have many possible combinations. Immunity standards usually require the product to meet Performance Criterion B for a few voltage-dip combinations that are typical of the environments in which the products will be used. I.e., the product may act up, as long as it recovers without user intervention.

Voltage interruptions are usually caused by problems with the alternating- current (AC) power distribution system, thus their duration is widely variable. Immunity standards usually require the product to meet Performance Criterion B or C for a few voltage-interruption durations that are typical of the environments in which the products will be used. I.e., for short voltage interruptions the product may act up, as long as it recovers without user intervention; while for long voltage interruptions the product may act up and require user intervention to recover, as long as it isn't damaged.

The table below summarizes the evolution of Voltage Dip/ Voltage Interruption standards for commercial electronic products. Medical electronics and military electronics may have their own special requirements. The links take you to summaries of the standards and their amendments. "(Modified)" means that the standard/ amendment differs from the reference standard/ amendment. Entries in bold text are currently active for undated references.

Evolution of Voltage Dip/ Voltage Interruption Standards for Commercial Electronic Products
Year Reference Year European Union Year Australia & New Zealand Notes
1994 IEC 1000-4-11:1994 Edition 1 1994 EN 61000-4-11:1994      
1997 IEC 61000-4-11:1994 Edition 1   EN 61000-4-11:1994      
2000 IEC 61000-4-11:1994+A1:2000

IEC 61000-4-11:2001 Edition 1.1

          
2004 IEC 61000-4-11:2004 Edition 2 2004 EN 61000-4-11:2004 2005 AS/NZS 61000.4.11:2005  


AS/NZS 61000.4.11:2005 Electromagnetic compatibility (EMC) Part 4.11: Testing and measurement techniques - Voltage dips, short interruptions and voltage variations immunity tests

Equivalent to: IEC 61000-4-11:2004 Edition 2 (modified)
Replaces:
Replaced by:

For: Australia & New Zealand
Ratified/printed: 19 AUG 2005
May use starting: 19 AUG 2005
Must use starting: 19 AUG 2007
Must use until:
May use until:

References:
* IEC 61000-2-8

Referenced by:
* AS/NZS 61000.6.1:2006 (undated)
* AS/NZS 61000.6.2:2006 (undated)

Comments:

(hardcopy & d:\dbi\AS_NZS+61000.4.11-2005.pdf)


EN 61000-4-11:1994 Electromagnetic compatibility (EMC) - Part 4: Testing and measurement techniques - Section 11: Voltage dips, short interruptions and voltage variations immunity tests

Equivalent to: IEC 1000-4-11:1994 & IEC 61000-4-11:1994
Replaces:
Replaced by: EN 61000-4-11:1994+A1:2001

For: European Union
Ratified/printed: 1 JUN 1994
May use starting: 1 JUN 1994
Must use starting: 1 JUL 2001 (referenced by EN 50082-1:1997 for generic)
Must use until:
May use until:

References:
* IEV 50(161):1990
* IEC 68-1:1988
* IEC 1000-2-1:1990
* IEC 1000-2-2:1990
* IEC 1000-4-1:1992

Referenced by:
* EN 55014-2:1997
* EN 55014-2:1997+A1:2001
* EN 55024:1998
* EN 55024:1998+A1:2001
* EN 55024:1998+A1:2001+A2:2003
* EN 61000-6-2:1999

Comments:

(hardcopy)


EN 61000-4-11:1994+A1:2001 Electromagnetic compatibility (EMC) - Part 4: Testing and measurement techniques - Section 11: Voltage dips, short interruptions and voltage variations immunity tests

Equivalent to:
IEC 61000-4-11:1994+A1:2000
Replaces: EN 61000-4-11:1994
Replaced by: EN 61000-4-11:2004

For: European Union
Ratified/printed:
May use starting:
Must use starting:
Must use until: 3 AUG 2004
May use until: 1 JUN 2007

References:
* IEV 50(161):1990
* IEC 68-1:1988
* IEC 1000-2-1:1990
* IEC 1000-2-2:1990
* IEC 1000-4-1:1992

Referenced by:

Comments: Clause 8.1.1 changed - climatic conditions shall be within limits specified for the EUT and the test equipment. Clause 9 changed - classifications of test results changed to a through d. Clause 10 added - specific information required in test report.

(source)


EN 61000-4-11:2004 Electromagnetic compatibility (EMC) Part 4-11: Testing and measurement techniques - Voltage dips, short interruptions and voltage variations immunity tests

Equivalent to: IEC 61000-4-11:2004 Edition 2
Replaces: EN 61000-4-11:1994+A1:2001
Replaced by:

For: European Union
Ratified/printed: 3 AUG 2004
May use starting: 3 AUG 2004
Must use starting: 1 JUN 2007
Must use until:
May use until:

References:
* IEC/TR 61000-2-8

Referenced by:
* EN 50082-1:1997 (undated)
* EN 50082-2:1995 (undated)
* EN 61000-6-1:2001 (undated)
* EN 61000-6-2:2001 (undated)
* EN 61547:2009

Comments:

(hardcopy & d:\dbi\I.S.EN61000-4-11-2004.pdf)


IEC 1000-4-11:1994 Edition 1 Electromagnetic compatibility (EMC) - Part 4: Testing and measurement techniques - Section 11: Voltage dips, short interruptions and voltage variations immunity tests

Equivalent to: EN 61000-4-11:1994 & IEC 61000-4-11:1994 (reissued 1 JAN 1997)
Replaces:
Replaced by: IEC 61000-4-11:1994+A1:2000 & IEC 61000-4-11:2001 Edition 1.1

For:
Ratified/printed: JUN 1994
May use starting: JUN 1994
Must use starting: JUN 1994
Must use until: MAR 2001
May use until: MAR 2001

References:
* IEV 50(161):1990
* IEC 68-1:1988
* IEC 1000-2-1:1990
* IEC 1000-2-2:1990
* IEC 1000-4-1:1992

Referenced by:
* CISPR 14-2:1997 Edition 1
* EN 61547:1995
* EN 61547:1995+A1:2000
* IEC 61547:1995 Edition 1
* IEC 61547:1995+A1:2000

Comments:

(hardcopy)


IEC 61000-4-11:1994 Edition 1 Electromagnetic compatibility (EMC) - Part 4: Testing and measurement techniques - Section 11: Voltage dips, short interruptions and voltage variations immunity tests

Equivalent to: EN 61000-4-11:1994 & IEC 1000-4-11:1994 (reissued 1 JAN 1997)
Replaces:
Replaced by: IEC 61000-4-11:1994+A1:2000 & IEC 61000-4-11:2001 Edition 1.1

For:
Ratified/printed: JUN 1994
May use starting: JUN 1994
Must use starting: JUN 1994
Must use until: MAR 2001
May use until: MAR 2001

References:
* IEC 50(161):1990
* IEC 68-1:1988
* IEC 1000-2-1:1990
* IEC 1000-2-2:1990
* IEC 1000-4-1:1992

Referenced by:
* AS/NZS CISPR 14.2:2003
* AS/NZS CISPR 24:2002
* CISPR 14-2:1997+A1:2001
* CISPR 14-2:2001 Edition 1.1
* CISPR 24:1997 Edition 1
* CISPR 24:1997+A1:2001
* CISPR 24:1997+A1:2001+A2:2002
* IEC 61000-6-2:1999 Edition 1
* IEC 61326:2002 Edition 1

Comments:

(hardcopy)


IEC 61000-4-11:1994+A1:2000, or consolidated edition IEC 61000-4-11:2001 Edition 1.1 Electromagnetic compatibility (EMC) - Part 4-11: Testing and measurement techniques - Voltage dips, short interruptions and voltage variations immunity tests

Equivalent to: EN 61000-4-11:1994+A1:2001 & Replaces: IEC 1000-4-11:1994 & IEC 61000-4-11:1994
Replaced by: IEC 61000-4-11:2004 Edition 2

For:
Ratified/printed: MAR 2001
May use starting: MAR 2001
Must use starting: MAR 2001
Must use until: 24 MAR 2004
May use until: 24 MAR 2004

References:
* IEC 60050(161):1990
* IEC 60068-1:1988
* IEC 61000-2-1:1990
* IEC 61000-2-2:1990
* IEC 61000-4-1:1992

Referenced by:
* EN 61000-6-1:2001 ?
* EN 61000-6-2:2001 ?

Comments: Clause 8.1.1 changed - climatic conditions shall be within limits specified for the EUT and the test equipment. Clause 9 changed - classifications of test results changed to a through d. Clause 10 added - specific information required in test report.

(hardcopy & d:\dbi\iec61000-4-11.pdf)


IEC 61000-4-11:2004 Edition 2 Electromagnetic compatibility (EMC) Part 4.11: Testing and measurement techniques - Voltage dips, short interruptions and voltage variations immunity tests

Equivalent to: EN 61000-4-11:2004 & AS/NZS 61000.4.11:2005 (unmodified)
Replaces: IEC 61000-4-11:1994+A1:2000 & IEC 61000-4-11:2001 Edition 1.1
Replaced by:

For:
Ratified/printed: 24 MAR 2004
May use starting: 24 MAR 2004
Must use starting: 24 MAR 2004
Must use until:
May use until:

References:
* IEC 61000-2-8

Referenced by:
* CISPR 14-2:1997+A1:2001+A2:2008
* EN 55014-2:1997+A1:2001+A2:2008
* EN 61000-6-1:2007 (undated)
* EN 61000-6-2:2005 (undated)
* EN 61326-1:2006
* EN 61326-2-3:2006
* IEC 61000-6-1:1997 Edition 1 (undated)
* IEC 61000-6-1:2005 Edition 2 (undated)
* IEC 61000-6-2:2005 Edition 2 (undated)
* IEC 61326-1:2005 Edition 1
* IEC 61326-2-3:2006 Edition 1
* IEC 61547:2009 Edition 2

Comments:

(hardcopy & d:\dbi\I.S.EN61000-4-11-2004.pdf)


DISCLAIMER
These web pages are freely offered to anyone who wishes to use them. No warranty for their use is expressed or implied. The most-current versions may be downloaded from the our web site at http://www.dbicorporation.com/.

These web pages can point you to regulations and standards applying to your product(s), but please refer to the regulations and standards themselves when deciding how to test your product(s). A regulation's or standard's title gives you strong clues as to what it covers, but its scope (usually section 1) tells you for sure. Carefully check the footnotes in tables, to see if your product falls into an exception that lets you avoid unnecessary tests (or sometimes requires additional special testing). Exceptions that can help you also sometimes hide in the Test Setup section (usually section 7). Also check the Test Report section (usually section 10) for any special documentation required.

COMMENTS
If you refer to one or more of these documents in written communications, please attribute them to http://www.dbicorporation.com/. Similarly, if you link to them from your own web page(s), we would appreciate an E-mail to jrbarnes@iglou.com giving the universal resource link (URL) so that we may provide a reciprocal link.

Please send critiques, corrections, and/or additions to jrbarnes@iglou.com , or by snailmail to:
John Barnes
dBi Corporation
216 Hillsboro Ave
Lexington, KY 40511-2105


Robust Electronic Design, Inc. is the research arm of dBi Corporation, an A2LA-accredited EMC/EMI/ESD testing and consulting company based in Lexington, Kentucky. Our staff has been directly involved in putting over 115 major electronic products into mass production at Sycor, IBM, and Lexmark, as well as doing the EMC/ EMI/ ESD engineering tests and FCC/ CE-Marking approval tests for over 231 products and 3 testers developed by clients-- bringing them into compliance with both domestic and international laws and standards. Our staff has also served as an expert witness on electronics in three lawsuits. We have over 36 years experience in the computer and electronics industries developing electronic products and electronic equipment that:
  1. Work.
  2. Are safe and reliable.
  3. Can be manufactured, tested, repaired, and serviced economically.
  4. May be sold and used worldwide.
  5. Can be easily adapted/enhanced to meet new and changing requirements.

Our President, John R. Barnes, is a Professional Engineer (PE) licensed in the state of Kentucky, a NARTE-Certified Electromagnetic Compatibility Engineer (NCE), a NARTE-Certified Electromagnetic Compatibility Technician (NCT), a NARTE-Certified Electrostatic Discharge Control Engineer (ESDC Eng), a NARTE-Certified Electrostatic Discharge Control Technician (ESDC Tech), a NARTE-Certified Product Safety Engineer (PSE), a Senior Member of the IEEE (SM IEEE), and an Advanced-class amateur radio operator. He has written three books: Electronic System Design: Interference and Noise Control Techniques, which was published in English in 1987 and in Russian in 1990; and Robust Electronic Design Reference Book, Volumes I and II, which came out in 2004. John has also written articles on designing electronics for electrostatic discharge (ESD) immunity for Printed Circuit Design and Conformity magazines.

Robust Electronic Design, Inc. and dBi Corporation may be contacted by:

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Last revised January 6, 2010.