X2Y CAPACITORS
Bibliography

This web site is being maintained by John R. Barnes, who was the President and Chief Engineer of dBi Corporation from 2002 to September 30, 2013, when we closed because ObamaCrap made it too expensive for us to remain in business.

John R. Barnes KS4GL, PE, NCE, NCT, ESDC Eng, ESDC Tech, PSE, Master EMC Design Engineer, SM IEEE
February 6, 2012
jrbarnes@iglou.com

I received a SUBPOENA DUCES TECUM AND AD TESTIFICANDUM early last week, signed by David P. Shaw, an Administrative Law Judge of the United States International Trade Commission david.shaw@usitc.gov ordering me to:
  1. Provide documents concerning Investigation No. 337-TA-781 to Nina Tallon ( nina.tallon@wilmerhale.com , (202)663-6000) at Wilmer Cutler Pickering Hale and Dorr LLP's offices at 1875 Pennsylvania Avenue NW, Washington, DC 20006,
          AND FURTHERMORE
  2. "present yourself for purposes of your deposition upon oral examination on February 23, 2012 at 9:00am" at the above location (definitely not one of the better areas of town, about 3 blocks west of the "casa blanca"), "or at another time and place agreed upon, concerning the subject matter set forth in Attachment A hereto."

Reading through 26 pages of legal bullshit, I figured out that X2Y Attenuators, LLC is suing Intel, Apple, and HP for patent infringement. The following lawyers for Intel, Apple, and HP, at various offices of Wilmer Cutler Pickering Hale and Dorr LLP :

"believe that Mr. Barnes may have information relevant to this investigation" and furthermore "X2Y has identified Mr. Barnes, the President of dBi Corporation, as one of only two individuals with design experience who could provide evidence of the recognition of the benefits of X2Y Technology."

I don't believe either of the above statements. But, as ordered, I am providing everything that I can find on X2Y capacitors, and on X2Y's technology, in my files to Wilmer Cutler etc. Not knowing when-- or IF-- I'll ever get my stuff back, I'm preparing this bibliography and inventory list while I still have the items in hand.

[0001] "(2) Circuits - Only (1) X2Y."

[0002] "Alternative X2Y Component Attachment for Power Filtering," X2Y, Dec. 23, 2003.

[0003] "Application Suggestions for X2Y Technology," X2Y.

[0004] "Comparative Device-Only Measurements of X2Y, Arrays and Ordinary Capacitors," X2Y, Feb. 24, 2006.

[0005] "Comparison Testing, A Single X2Y Components vs. Three Standard Bulk Capacitors (1) X and (2) Y's, Line to Line testing, Both DUT's Referenced to ground," X2Y.

[0006] "Comparison Testing, A Single X2Y Component vs. Three Standard Capacitors (1) X and (2) Y's, Line to Ground and Line to Line Testing," X2Y.

[0007] "DC-to-DC Converters using X2Y Technology," X2Y, Dec. 3, 2003.

[0008] "DC-To-DC Converters using X2Y Technology," X2Y Note# 2009, V3.0, Apr. 28, 2005.

[0009] "Decoupling Multiple Power Planes," X2Y, Dec. 23, 2003.

[0010] Anthony, David J., "Ferrite Bead Removal," X2Y, July 2, 2003.

[0011] "General Testing Rules for X2Y Units."

[0012] "Generating PSpice models for X2Y capacitors from S-parameters," Phycomp Application Note, Jan. 2003.

[0013] "Get the Most from X2Y Capacitors with Proper Attachment Techniques," X2Y Application Note 3008, V1, 2/23/06.

[0014] "IC Decoupling and EMI Suppression using X2Y Technology," X2Y, Dec. 12, 2003.

[0015] "Internal Model of X2Y," X2Y, Sept. 2, 2003.

[0016] "Measurement and Comparative S21 Performance of Raw and Mounted Decoupling Capacitors," X2Y Note# 3006, V2, Apr. 24, 2007.

[0017] "Metal Disk Test Module for X2Y Capacitor Units."

[0018] "New! X2Y Dual Line Chip."

[0019] "New! X2Y Dual Line Chip."

[0020] "PCB Design for TDR Testing."

[0021] "Replacing Feedthrough Capacitors with X2Y Technology," X2Y, Jan. 5, 2004.

[0022] "RF Filtering for Audio Amplifier Circuits," X2Y, May 9. 2003.

[0023] "Shunt Measurement, (1) X2Y vs. (2) Standard Capacitors," X2Y.

[0024] "Shunt Measurement X2Y Standard Capacitors," X2Y, Sept. 27, 2003.

[0025] "Squib Carrier Double Sided."

[0026] "Squib filter."

[0027] "Surface Count Ceramic Capacitors."

[0028] "The World's Best Single Component Filter."

[0029] Impedance and phase plot.

[0030] Impedance and phase plot.

[0031] Impedance and phase plot.

[0032] Impedance and phase plot.

[0033] Impedance and phase plot.

[0034] Impedance and phase plot.

[0035] Impedance and phase plot.

[0036] Impedance and phase plot.

[0037] Impedance and phase plot.

[0038] Impedance and phase plot.

[0039] Impedance and phase plot.

[0040] Impedance and phase plot.

[0041] Impedance and phase plot.

[0042] Impedance and phase plot.

[0043] Impedance and phase plot.

[0044] Impedance and phase plot.

[0045] Impedance and phase plot.

[0046] Impedance and phase plot.

[0047] Impedance and phase plot.

[0048] Impedance and phase plot.

[0049] Impedance and phase plot.

[0050] Application Notes.

[0051] X2Y Application Notes.

[0052] X2Y Attenuators, LLC 0805 Chip Filter.

[0053] X2Y Attenuators, LLC 1206 Chip Filter.

[0054] X2Y Attenuators, LLC 1410 Chip Filter.

[0055] "X2Y Capacitors in IC Back-Side Mounting Applications," X2Y Note# 3010, V1, Oct. 25, 2006.

[0056] "X2Y Circuit 1 & Circuit 2 Configurations," X2Y, Nov. 25, 2003.

[0057] "X2Y Comparative Decoupling Performance in 4 Layer PCBs," X2Y.

[0058] "X2Y DC Power Filtering (Ceramic, Ferrite, MOV)," X2y, Aug. 03, 2003.

[0059] "X2Y G1/G2 Attachment," X2Y, Oct. 27, 2003.

[0060] "X2Y Inductance Ratings," X2Y Note# 3013, V1, Sept. 9, 2008.

[0061] "X2Y Live FPGA Power Bypass,", X2Y Attenuators, Jan. 25, 2006.

[0062] "X2Y Presentation."

[0063] "X2Y Published Articles."

[0064] "X2Y Solution for Decoupling Printed Circuit Boards," X2Y, Dec. 12, 2003.

[0065] "X2Y Solution for Decoupling Printed Circuit Boards," X2Y, Aug. 18, 2003.

[0066] "X2Y Solution for Decoupling Printed Circuit Boards," X2Y, Aug. 18, 2003.

[0067] "X2Y Series Surface-mount ceramic multilayer Filter Capacitors."

[0068] "X2Y Technology: Component Grounding," Application Note 7032001-1.

[0069] "X2Y Technology Presentation," X2Y, Oct. 20, 2003.

[0070} fax cover letter from Anthony A. Anthony.

[0071] cover letter for some test samples from Dave Anthony.

[0072] cover letter for some test samples from Bill Anthony.

[0073] E-mail from Bill Anthony.

[0074] E-mail from Bill Anthony.

[0075] Anthony, Tony, and Musil, Ken, "New Capacitor Technology," Future Circuits International, no. 5, pp. 63-69, xxxx.

[0076] Anthony, Tony, and Musil, Ken, "New Capacitor Technology," Future Circuits International, no. 5, pp. 63-69, xxxx.

[0077] cover letter for some test samples from Tony Anthony.

[0078] copy of shipping label to Tony Anthony.

[0079] E-mail from John Barnes.

[0080] E-mail from John Barnes.

[0081} post on SI-LIST by John Barnes.

[0082] Barnes, John R., "Power Distribution on Printed Circuit Boards (PCB's)," Mar. 28, 2000 (unpublished).

[0083] Barnes, John R., "Power Distribution on Printed Circuit Boards," Apr. 17, 2000 (unpublished).

[0084] Derksen, Rob, Bouma, Bart, Muccioli, Jim, and Anthony, Dave, "Reducing EMI/RFI Susceptibility," Oct. 1, 2003.

[0085] Derksen, Rob, Bouma, Bart, Muccioli, Jim, and Anthony, Dave, "X2Y Capacitors Reduce EMI/RFI Susceptibility of Computer Equipment," EPN Online, Feb. 2004.

[0086] Derksen, Rob, Bouma, Bart, Muccioli, Jim, and Anthony, Dave, "X2Y Integrated Passive Devices : A Breakthrough in High Speed Decoupling and Broadband Filtering," X2Y Attenuators.

[0087] Fiore, Richard, "Capacitor ESR Measurement Technique," Ameriacn Technical Ceramics.

[0088] Fiore, Richard, "ESR Loss Factors," Ameriacn Technical Ceramics.

[0089] Fiore, Richard, "ESR Losses in Ceramic Capacitors," Microwave Product Digest, Sept. 1999.

[0090] Fiore, Richard, "Piezoelectric Effect in Ceramic Capacitors," American Technical Ceramics.

[0091] Muccioli. James P., Anthony, Anthony A., and Anthony, David, "A broadband filter proves itself in multiple dielectrics," ITEM Update 2001, pp. 82-93, 2001.

[0092] Muccioli, James, Anthony, Anthony A., and Anthony, David, "A microwave test fixture for measuring four-terminal passive components from DC to 10GHz," Interference Technology Annual Guide 2003, pp. 160-173, 2003.

[0093] Muccioli, James, Sanders, Dale, and Bouma, Bart, "A SPICE model for a capacitive circuit from kHz-GHz," Interference Technology EMC Test & Design Guide 2003, pp. 40-46, 2003.

[0094] Muccioli, James, Anthony, Anthony A., Anthony, William M, and Walz, Douglas S., "Broadband Testing of Low-Cost Filter Solutions for DC Motors," ITEM Update 2000.

[0095] Muccioli, James P., and Sanders, Dale L., "Decoupling Capacitors, A Designer's Roadmap to Optimal Decoupling Networks for Integrated Circuits," Freescale Technology Forum, Orlando, FL, 2005.

[0096] Muccioli, James P., and Anthony, Anthony A., "Dynamic Testing of a Dual Line Filter For Common and Differential Mode Attenuation using a Spectrum Analyzer," ITEM 2000, pp. 102-110, 2000.

[0097] Muccioli, James, and Sanders, Dale, "High Speed Decoupling Strategies with fewer Capacitors," X2Y Attenuators.

[0098] Muccioli, James P., and Sanders, Dale L., "Integrating the Right Decoupling Capacitor: Busting the 9 Greatest Capacitor Myths," X2Y, July 19, 2005.

[0099] Mucciolo, James, Anthony, David J., and Anthony, Anthony A., "RF Filtering for Audio Amplifier Circuits," Passive Component, March 1, 2003.

[0100] Sanders, Dale L., Muccioli, James P., and Anthony, Anthony A., "A Better Approach to DC Power Filtering,"2004 International Symposium on Electromagnetic Compatibility, Day 2, Silicon Valley, CA, Aug. 9-13, 2004, pp. 616-620.

[0101] Sanders, Dale L., Muccioli, James P., and Anthony, Anthony A., "Comparison of MLCC and X2Y Technology for Use in Decoupling Circuits," Capacitor and Resistor Technology Symposium 2004, San Antonio, TX, Mar. 29-Apr. 1, 2004, pp. 78-83.

[0102] Sanders, Dale L., Muccioli, James P., and Anthony, Anthony A., "Comparison of MLCC and X2Y Technology for Use in Decoupling Circuits," Capacitor and Resistor Technology Symposium 2004, San Antonio, TX, Mar. 29-Apr. 1, 2004, pp. 78-83.

[0103] Sanders, Dale L., Muccioli, James P., and Anthony, Anthony A., "Comparison of MLCC and X2Y Technology for Use in Decoupling Circuits (Presentation)," Capacitor and Resistor Technology Symposium 2004 , San Antonio, TX, Mar. 29-Apr. 1, 2004, pp. xx-xx.

[0104] Sanders, Dale L., Muccioli, James P., and Anthony, Anthony A., "Grounding Requirements for Optimum Performance Results with X2Y(R) Technology on a Printed Circuit Board," 2004 International Symposium on Electromagnetic Compatibility, Day 2, Silicon Valley, CA, Aug. 9-13, 2004, pp. 626-629.

[0105] Sanders, Dale L., Muccioni, James P., North, Terry M., and Slattery, Kevin P., "Reducing Switching Transients from ICs in Power Distribution Systems (PDS) on PCBs," 10th Annual Automotive Electronics Reliability Workshop , Novi, MI, Apr. 24, 2005, pp. xx-xx.

[0106] Sanders, Dale, "Take steps to reduce antiresonance in decoupling," EDN, vol. 49, no. 8, pp. 70, 72, Apr. 15, 2004.

[0107] Sanders, Dale L., Muccioni, James P., North, Terry M., and Slattery, Kevin P., "The Quantitative Measurement of the Effectiveness of Decoupling Capacitors in Controlling Switching Transients from Microprocessors," 25th Annual Passive Components Conference, Palm Springs, CA, Mar. 21-24, 2005, pp. 173-188b.

[0108] Sanders, Dale L., Muccioni, James P., North, Terry M., and Slattery, Kevin P., "The Quantitative Measurement of the Effectiveness of Decoupling Capacitors in Controlling Switching Transients from Microprocessors (Presentation)," 25th Annual Passive Components Conference, Palm Springs, CA, Mar. 21-24, 2005, pp. xx-xx.

[0109] Sanders, D. L., Muccioli, J. P., Anthony, A. A., and Anthony, D. J., "X2Y Technology Used for Decoupling," X2Y Attenuators, 2004.

[0110] posting to SI-List from Larry Smith.

[0111] Weir, Steve, "Application of X2Y Capacitors in Power Delivery Networks," IEEE RTP Chapter, Apr. 1, 2008.

[0112] Weir, Steve, "Bypass Capacitor Inductance, Data Sheet Simplicity to Practical Reality," Teraspeed Consulting Group.

[0113] Weir, Steve, "Considerations for Capacitor Selection in FPGA Designs (Presentation)," Proceedings of the 25th Symposium for Passive Components, Palm Springs, CA, Mar. 21-24, 2005, pp. xx-xx.

[0114] Weir, Steve, and McMorrow, Scott, "High Performance FPGA Bypass Networks," DesignCon 2005, Santa Clara, CA, Jan. 31-Feb. 3, 2005, pp. xx-xx.

[0115] Weir, Steve, and McMorrow, Scott, "High Performance FPGA Bypass Networks (Presentation)," DesignCon 2005, Santa Clara, CA, Jan. 31-Feb. 3, 2005, pp. xx-xx.

[0116] Weir, Steve, "Impact of PCB Stack-up and Capacitor Via Design In Power Distribution Design," IEEE EMC Society SCV Meeting, Feb. 14, 2006.

[0117] Weir, Steve, "Measurement and comparative S21 performance of raw and mounted decoupling capacitors," Interference Technology, pp. 72, 74-77, EMC Design & Test Guide 2004.

[0118] "Understanding Capacitor Inductance and Measurement in Power Bypass Applications," X2Y Note# 3009, V1, Feb. 27, 2006.

[0119] Weir, Steve, "X2Y Capacitors for Instrumentation Amplifier RFI Suppression," X2Y Application Note 2008, v. 3.0, 4/28/05.

[0120] Weir, Steve, "X2L FPGA SerDes Bypass," X2Y Attenuators, Dec. 11, 2008.

[0121] Zasio, John, "Current Source," Speeding Edge, vol. 1 no. 4, pp. xx-xx, xxxx.

[0122] Barnes, John R., Electronics System Design: Interference and Noise Control Techniques. Prentice-Hall, Englewood Cliffs, NJ, 1987.

[0123] Russian translation of Barnes, John R., Electronics System Design: Interference and Noise Control Techniques. Russia: Mir, 1990.

[0124] Sample kit from Phicomp of X2Y Integrated Passive Devices, containing:

[0125] A FedEx envelope sent to me by Bill Anthony of X2Y Attenuators in March 2000, containing:

dBi Corporation was a one-man test house (testing laboratory) based in Lexington, Kentucky, testing a wide variety of commercial electronic products for electromagnetic compatibility (EMC), electromagnetic interference (EMI), and electrostatic discharge (ESD) under its ISO 17025 accreditation. dBi was founded in Winchester, Kentucky in 1995 by Donald R. Bush, shortly after he retired from 30 years service with IBM Lexington's/ Lexmark's EMC Lab. John R. Barnes, who'd worked with Don at IBM Lexington and Lexmark, bought dBi in 2002 after Don's death, and moved the company to Lexington, Kentucky. John closed dBi at 11:59pm EDT on September 30, 2013, because ObamaCrap had increased operating expenses to the point that we could no longer afford to remain in business.

We'd like to thank all of the clients who chose dBi to test their products from 1995 to 2013. Below is a brief summary of our accomplishments during the 18 years we were in business.

From 1995 to 2001, under Don Bush's ownership and operation, dBi:

From 2002 to 2013, under John Barnes' ownership and operation, dBi:

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Last revised February 5, 2012.