Magnetic Field Immunity Standards for Commercial Electronic Products

dBi Corporation


A2LA Accredited Laboratory
Certificate Number 1985-01

John R. Barnes KS4GL, PE, NCE, NCT, ESDC Eng, ESDC Tech, PSE, SM IEEE
December 3, 2011
jrbarnes@iglou.com

Magnetic Field Immunity tests check the behavior of products when exposed to powerline- frequency magnetic fields, such as from poorly- routed power wiring. Because these fields are continuous, and out of the user's control, immunity standards require the product to meet Performance Criterion A. I.e., it must operate normally, without any user intervention.

The table below summarizes the evolution of Magnetic Field Immunity standards for commercial electronic products. Medical electronics and military electronics may have their own special requirements. The links take you to summaries of the standards and their amendments. "(Modified)" means that the standard/ amendment differs from the reference standard/ amendment. Entries in bold text are currently active for undated references. Please note that in Australia and New Zealand, products only need to comply with safety and emission standards to bear the C-Tick mark.

Evolution of Magnetic Field Immunity Standards for Commercial Electronic Products
Year Reference Year European Union Year Australia & New Zealand Notes
1993 IEC 1000-4-8:1993 Edition 1 1993 EN 61000-4-8:1993      
1997 IEC 61000-4-8:1993 Edition 1   EN 61000-4-8:1993      
2000 IEC 61000-4-8:1993 +A1:2000

IEC 61000-4-8:2001 Edition 1.1

 2001 EN 61000-4-8:1993 +A1:2001 2002 AS/NZS 61000.4.8:2002  
2009 IEC 61000-4-8:2009 Edition 2 2010; EN 61000-4-8:2010      


AS/NZS 61000.4.8:2002 Electromagnetic compatibility (EMC) Part 4.8: Testing and measurement techniques - Power frequency magnetic field immunity test

Equivalent to: IEC 61000-4-8:1993+A1:2000 & IEC 61000-4-8:2001 Edition 1.1
Replaces:
Replaced by:

For: Australia & New Zealand
Ratified/printed: 1 NOV 2002
May use starting: 1 NOV 2002
Must use starting: 1 NOV 2004
Must use until:
May use until:

References:
* IEC 60068-1:1988

Referenced by:
* AS/NZS 61000.6.1:2006 (undated)
* AS/NZS 61000.6.2:2006 (undated)

Comments:

(hardcopy & E:\dbi\AS_NZS+61000.4.8-2002.pdf)


EN 61000-4-8:1993 Electromagnetic compatibility (EMC) - Part 4: Testing and measurement techniques - Section 8: Power frequency magnetic field immunity test - Basic EMC Publication

Equivalent to: IEC 1000-4-8:1993 Edition 1 & IEC 61000-4-8:1993 Edition 1
Replaces:
Replaced by: EN 61000-4-8:1993+A1:2001

For: European Union
Ratified/printed: 16 JUN 1992
May use starting: 29 SEP 1993
Must use starting: 1 JUN 1994
Must use until: 1 DEC 2000
May use until: 1 DEC 2003

References:
* IEC 68-1:1988

Referenced by:
* EN 50082-1:1997 (undated)
* EN 50082-2:1995 (undated)
* EN 55024:1998
* EN 55024:2010
* EN 61000-6-1:2001 (undated)
* EN 61000-6-2:1999
* EN 61000-6-2:2001 (undated)
* EN 61547:2009
* IEC 61000-4-6:2003+A1:2004

Comments:

(hardcopy)


EN 61000-4-8:1993+A1:2001 Electromagnetic compatibility (EMC) - Part 4: Testing and measurement techniques - Section 8: Power frequency magnetic field immunity test - Basic EMC Publication

Equivalent to: IEC 61000-4-8:1993+A1:2000 & IEC 61000-4-8:2001 Edition 1.1
Replaces: EN 61000-4-8:1993
Replaced by: EN 61000-4-8:2010

For: European Union
Ratified/printed: 1 DEC 2000
May use starting: 1 DEC 2000
Must use starting: 1 DEC 2003
Must use until:
May use until:

References:
* IEC 68-1:1988

Referenced by:
* EN 50082-1:1997 (undated)
* EN 50082-2:1995 (undated)
* EN 61000-6-1:2001 (undated)
* EN 61000-6-2:2001 (undated)
* EN 61547:2009

Comments:

(hardcopy & E:\dbi\AS_NZS+61000.4.8-2002.pdf & E:\dbi\iec61000-4-8.pdf)


EN 61000-4-8:2010 Electromagnetic compatibility (EMC) - Part 4: Testing and measurement techniques - Section 8: Power frequency magnetic field immunity test - Basic EMC Publication

Equivalent to: IEC 61000-4-8:2009 Edition 2
Replaces: EN 61000-4-8:1993+A1:2001
Replaced by:

For: European Union
Ratified/printed: 1 FEB 2010
May use starting:
Must use starting:
Must use until:
May use until:

References:
* IEC 68-1:1988

Referenced by:
* EN 50082-1:1997 (undated)
* EN 50082-2:1995 (undated)
* EN 61000-6-1:2001 (undated)
* EN 61000-6-2:2001 (undated)

Comments:

(hardcopy & E:\dbi\I.S. EN 61000-4-8-2010 Electromagnetic Compatibility (emc) - Part 4-8- Testing and Measurement Techniques - P.pdf)


IEC 1000-4-8:1993 Edition 1 (reissued 1 JAN 1997) Electromagnetic compatibility (EMC) - Part 4: Testing and measurement techniques - Section 8: Power frequency magnetic field immunity test - Basic EMC Publication

Equivalent to: EN 61000-4-8:1993 & IEC 61000-4-8:1993 Issue 1 (reissued 1 JAN 1997)
Replaces:
Replaced by: IEC 61000-4-8:1993+A1:2000

For:
Ratified/printed: JUN 1993
May use starting: JUN 1993
Must use starting: JUN 1993
Must use until: MAR 2001
May use until: MAR 2001

References:
* IEC 68-1:1988

Referenced by:
* EN 50082-1:1997 (undated)
* EN 50082-2:1995 (undated)
* EN 61000-6-1:2001 (undated)
* EN 61000-6-2:2001 (undated)
* EN 61547:1995
* IEC 61547:1995 Edition 1

Comments:

(hardcopy)


IEC 61000-4-8:1993 Edition 1 Electromagnetic compatibility (EMC) - Part 4: Testing and measurement techniques - Section 8: Power frequency magnetic field immunity test - Basic EMC Publication

Equivalent to: EN 61000-4-8:1993 & IEC 1000-4-8:1993 Edition 1 (reissued 1 JAN 1997)
Replaces:
Replaced by: IEC 61000-4-8:1993+A1:2000 & IEC 61000-4-8:2001

For:
Ratified/printed: JUN 1993
May use starting: JUN 1993
Must use starting: JUN 1993
Must use until: MAR 2001
May use until: MAR 2001

References:
* IEC 68-1:1988

Referenced by:
* AS/NZS CISPR 24:2002
* CISPR 24:1997 Edition 1
* EN 50082-1:1997 (undated)
* EN 50082-2:1995 (undated)
* EN 61000-6-1:2001 (undated)
* EN 61000-6-1:2007 (undated)
* EN 61000-6-2:2001 (undated)
* EN 61000-6-2:2005 (undated)
* EN 61326-1:2006
* EN 61326-2-3:2006
* IEC 61000-6-1:1997 (undated)
* IEC 61000-6-1:2005 (undated)
* IEC 61000-6-2:1999 Edition 1
* IEC 61000-6-2:2005 (undated)
* IEC 61326:2002 Edition 1
* IEC 61326-1:2005 Edition 1
* IEC 61326-2-3:2006 Edition 1
* IEC 61547:2009 Edition 2

Comments:

(hardcopy)


IEC 61000-4-8:1993+A1:2000 or consolidated edition IEC 61000-4-8:2001 Edition 1.1 Electromagnetic compatibility (EMC) Part 4.8: Testing and measurement techniques - Power frequency magnetic field immunity test

Equivalent to: EN 61000-4-8:1993+A1:2001 & AS/NZS 61000.4.8:2002
Replaces: IEC 1000-4-8:1993 Edition 1 & IEC 61000-4-8:1993 Edition 1
Replaced by: IEC 61000-4-8:2009 Edition 2

For:
Ratified/printed: MAR 2001
May use starting: MAR 2001
Must use starting: MAR 2001
Must use until: 3 SEP 2009
May use until: 3 SEP 2009

References:
* IEC 68-1:1988

Referenced by:
* EN 50082-1:1997 (undated)
* EN 50082-2:1995 (undated)
* EN 61000-6-1:2001 (undated)
* EN 61000-6-1:2007 (undated)
* EN 61000-6-2:2001 (undated)
* EN 61000-6-2:2005 (undated)
* IEC 61000-6-1:1997 Edition 1 (undated)
* IEC 61000-6-1:2005 Edition 2 (undated)
* IEC 61000-6-2:2005 Edition 2 (undated)

Comments: Clause 8.1.1 changed - climatic conditions shall be within limits specified for the EUT and the test equipment. Clause 9 changed - classifications of test results changed to a through d. Clause 10 added - specific information required in test report.

(hardcopy & E:\dbi\AS_NZS+61000.4.8-2002.pdf & E:\dbi\iec61000-4-8.pdf)


IEC 61000-4-8:2009 Edition 2 Electromagnetic compatibility (EMC) Part 4.8: Testing and measurement techniques - Power frequency magnetic field immunity test

Equivalent to: EN 61000-4-8:2010
Replaces: IEC 61000-4-8:1993+A1:2000 & IEC 61000-4-8:2001 Edition 1.1
Replaced by:

For:
Ratified/printed: 3 SEP 2009
May use starting: 3 SEP 2009
Must use starting: 3 SEP 2009
Must use until:
May use until:

References:

Referenced by:
* EN 50082-1:1997 (undated)
* EN 50082-2:1995 (undated)
* EN 61000-6-1:2001 (undated)
* EN 61000-6-1:2007 (undated)
* EN 61000-6-2:2001 (undated)
* EN 61000-6-2:2005 (undated)
* IEC 61000-6-1:1997 (undated)
* IEC 61000-6-1:2005 (undated)
* IEC 61000-6-2:2005 (undated)

Comments:

(source)


DISCLAIMER
These web pages are freely offered to anyone who wishes to use them. No warranty for their use is expressed or implied. The most-current versions may be downloaded from the our web site at http://www.dbicorporation.com/.

These web pages can point you to regulations and standards applying to your product(s), but please refer to the regulations and standards themselves when deciding how to test your product(s). A regulation's or standard's title gives you strong clues as to what it covers, but its scope (usually section 1) tells you for sure. Carefully check the footnotes in tables, to see if your product falls into an exception that lets you avoid unnecessary tests (or sometimes requires additional special testing). Exceptions that can help you also sometimes hide in the Test Setup section (usually section 7). Also check the Test Report section (usually section 10) for any special documentation required.

COMMENTS
If you refer to one or more of these documents in written communications, please attribute them to http://www.dbicorporation.com/. Similarly, if you link to them from your own web page(s), we would appreciate an E-mail to jrbarnes@iglou.com giving the universal resource link (URL) so that we may provide a reciprocal link.

Please send critiques, corrections, and/or additions to jrbarnes@iglou.com , or by snailmail to:
John Barnes
dBi Corporation
216 Hillsboro Ave
Lexington, KY 40511-2105

dBi Corporation is an A2LA-accredited Electromagnetic Compatibility (EMC)/ Electromagnetic Interference (EMI)/ Electrostatic Discharge (ESD) test laboratory (test house) based in Lexington, Kentucky. In the last nine years we have tested over 337 products developed by our clients. Out of 301 products for which we have done the approval testing, so far we have gotten all but 4 to meet the applicable United States (FCC), Canadian (Industry Canada (IC)), European Union (CE Marking, EN), Australian and New Zealand (AS/NZS) standards and legal requirements for marketing/ sale in those countries and market areas. We have also served as an expert witness on electronics in three lawsuits.

Before joining dBi, our staff was directly involved in putting over 115 major electronic products into mass production at Sycor, IBM, and Lexmark. Our staff has over 38 years experience in the computer and electronics industries, developing electronic products and electronic equipment that:

  1. Work.
  2. Are safe and reliable.
  3. Can be manufactured, tested, repaired, and serviced economically.
  4. May be sold and used worldwide.
  5. Can be easily adapted/enhanced to meet new and changing requirements.

Our President, John R. Barnes, is a Professional Engineer (PE) licensed in the state of Kentucky, a NARTE-Certified Electromagnetic Compatibility Engineer (NCE), a NARTE-Certified Electromagnetic Compatibility Technician (NCT), a NARTE-Certified Electrostatic Discharge Control Engineer (ESDC Eng), a NARTE-Certified Electrostatic Discharge Control Technician (ESDC Tech), a NARTE-Certified Product Safety Engineer (PSE), a Senior Member of the IEEE (SM IEEE), and an Advanced-class amateur radio operator. He has written three books: Electronic System Design: Interference and Noise Control Techniques, which was published in English in 1987 and in Russian in 1990; and Robust Electronic Design Reference Book, Volumes I and II, which came out in 2004. John has also written articles on designing electronics for electrostatic discharge (ESD) immunity for Printed Circuit Design and Conformity magazines.

dBi Corporation can be contacted by:

Go to Main Web Site Index Go to Full Standards Index Go to ITE Standards Index Go to Residential/ Commercial Standards Index Go to Industrial Standards Index
Go to Lab Equipment Standards Index Go to Audio/ Video Equipment Standards Index Go to Lamps/ Luminaires Standards Index Go to Appliance Standards Index
Last revised December 3, 2011.